Call Now 0731-464074

Send Messagesupport@lms.holkar.org

Student Section

Indexing of a Cubic Crystal X-Ray Diffraction Patterns by Analytical Method

Loading...
Loading...
Loading...
Step I: Identify the peaks and their proper 2? values. Here are the typical eight 2?-value entry fields provided with this interface. You can increase or delete rows for data elements depending upon the test X-ray pattern. Also choose the relevant wavelength of X-ray source.
 
  • "Elements of X-ray Diffraction" by B.D. Cullity (Addison-Wesley Publishing Company, Inc. 1956)
  • "Introduction to Crystallography and Mineral Crystal Systems" by Mike Howard and Darcy Howard (Wiley, 2012)
  • "X-ray Diffraction: A Practical Approach" by C.S. Barrett, T.B. Massalski, and D.L. Basset (Springer, 2009)
  • "Crystallography and Crystal Defects" by A. Kelly and K. H. Grover (Wiley, 2012)
  • "X-Ray Diffraction: In Crystals, Imperfect Crystals, and Amorphous Bodies" by Andre Guinier (W.H. Freeman, 1994)
  • "X-Ray Diffraction and the Identification and Analysis of Clay Minerals" by Duane M. Moore (Oxford University Press, 1987)
  • "Powder Diffraction: Theory and Practice" by R. E. Dinnebier and S. J. L. Billinge (Cambridge University Press, 2008)
  • "Fundamentals of Crystallography" by C. Giacovazzo and others (Oxford University Press, 1992)
  • "X-Ray Diffraction: A Practical Approach" by B.E. Warren (Oxford University Press, 1990)
  • "Introduction to Crystallography" by Donald E. Sands (Dover Publications, 1993)
  • "Introduction to X-ray Powder Diffractometry" by Ron Jenkins (John Wiley & Sons, 1997)
  • "X-ray Diffraction: A Practical Guide for Phase Analysis" by T. Zoltan (CRC Press, 2018)
  • "X-ray Crystallography" by William Clegg (Oxford University Press, 2010)
  • "Crystallography Made Crystal Clear: A Guide for Users of Macromolecular Models" by Gale Rhodes (Academic Press, 2006)
  • "X-ray Structure Determination: A Practical Guide" by George H. Stout and Lyle H. Jensen (John Wiley & Sons, 1989)
Q 01: X-rays can be deflected by:
  • (A) Electric Field
  • (B) Magnetic Field
  • (C) Electromagnetic Field
  • (D) None of the fields

Q 02: The diffraction pattern of copper metal was measured with X-ray radiation of wavelength of 1.315 Å. The first order Bragg diffraction peak was found at an angle 2Θ of 60°. The d-spacing between the diffracting planes in the copper metal is
  • (A) 3.25 Å
  • (B) 2.545 Å
  • (C) 0.415 Å
  • (D) 1.315 Å

Q 03: Interplanar distance of the reflecting plane of lithium fluoride (Lif) analysing crystal is 4 Å . Calculate the wavelength of a second-order differential line with a 30° angle of incidence.
  • (A). 1 Å
  • (B) 2 Å
  • (c) 3 Å
  • (D) 4 Å

Q 04: In goniometer, if analysing crystal rotates at angle of 30°, the detector should rotate at an angle of
  • (A) 15°
  • (B) 30°
  • (C) 45°
  • (D) 60°

Q 05:One of the widely used target material for generation of X-ray spectral line is
  • (A) Zinc
  • (B) Molybdenum
  • (C) Xenon
  • (D) Manganese

Q 06: Which of the X-ray reflections necessarily absent in FCC structure?
  • (A) h, k and l mixed (even and odd)
  • (B) (h + k + l) odd
  • (C) h and k mixed (even and odd)
  • (D) None

Q 07: Which of the X-ray reflections necessarily absent in BCC structure?
  • (A) h, k and l mixed (even and odd)
  • (B) (h + k + l) odd
  • (C) h and k mixed (even and odd)
  • (D) None

Q 08: Which of the X-ray reflections may be present in SCC?
  • (A) All
  • (B) h, k and l unmixed (even and odd)
  • (C) (h + k + l) even
  • (D) h and k unmixed (even and odd)

Q 09: Which of the X-ray reflections may be present in BCC?
  • (A) All
  • (B) h, k and l unmixed (even and odd)
  • (C) (h + k + l) even
  • (D) h and k unmixed (even and odd)

Q 10: Which of the X-ray reflections may be present in FCC?
  • (A) All
  • (B) h, k and l unmixed (even and odd)
  • (C) (h + k + l) even
  • (D) h and k unmixed (even and odd)